ASTM F1467 – Standard Guide for Use of an X-Ray Tester (almost equal to10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
Product Details
- Published:
- 03/01/2018
- Number of Pages:
- 18
- File Size:
- 1 file , 400 KB
- Redline File Size:
- 2 files , 810 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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