This Standard provides a method for the protection of items,components and assemblies, e.g., field effect transistors, microdiodes, etc., which may be damaged by field forces (electrostatic,electromagnetic, magnetic or radioactive) encountered innon-operating environments.
- Edition:
- 5
- Published:
- 01/30/2015
- Number of Pages:
- 2
- File Size:
- 1 file , 31 KB
Reviews
There are no reviews yet.