This Standard provides a method for the protection of items,components and assemblies, e.g., field effect transistors, microdiodes, etc., which may be damaged by field forces (electrostatic,electromagnetic, magnetic or radioactive) encountered innon-operating environments.
- Edition:
- 4
- Published:
- 06/28/2013
- Number of Pages:
- 2
- File Size:
- 1 file , 32 KB
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