This Standard provides a method for the protection of items, components and assemblies, e.g., field effect transistors, micro diodes, etc., which may be damaged by field forces (electrostatic, electromagnetic, magnetic or radioactive) encountered in non-operating environments.
- Edition:
- 5
- Published:
- 01/30/2015
- Number of Pages:
- 2
- File Size:
- 1 file , 140 KB
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