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ECIA EIA-364-25C

Original price was: $30.00.Current price is: $15.00.

This standard establishes a test method to be followed for probe damagetesting, intended primarily for round socket contacts in electricalconnectors and possibly applicable to other type contacts as well.Thepurpose of this test is to simulate a form of field abuse of contactsduring test by inserting probes into connector socket contacts.

Edition:
C
Published:
05/01/1998
ANSI:
ANSI Approved
Number of Pages:
9
File Size:
0 files

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ECIA EIA-364-25C
Original price was: $30.00.Current price is: $15.00.