ESD JS-001-2023

This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

All packaged semiconductor devices, thin film circuits, acoustic wave devices, optoelectronic devices, hybrid integrated circuits (HICs), discrete, and multi-chip modules (MCMs) containing any of these devices as well as unpackaged singulated bare die, and die which are still part of a wafer are to be evaluated according to this standard.

Published:

2023

ISBN(s):

1585373435

ANSI:

ANSI Approved

Number of Pages:

56

File Size:

1 file , 1.2 MB

Note:

This product is unavailable in Russia, Ukraine, Belarus