This document pertains to Very Fast Transmission Line Pulse (VF-TLP) testing techniques of semiconductor components.It establishes guidelines and standard practices presently used by development, research and reliability engineers in both universities and industry for VF-TLP testing.This document explains a methodology for both testing and reporting information associated with VF-TLP testing.
- Published:
- 2007
- ISBN(s):
- 1585371440
- ANSI:
- ANSI Approved
- Number of Pages:
- 38
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