This document is a redesignation and revision of ANSI/ESD SP5.5.1-2004 and pertains to transmission line pulse(TLP) testing techniques of semiconductor components. The purpose of this document is to establish a methodology for both testing and reporting information associated with TLP testing.
- Published:
- 2008
- ISBN(s):
- 1585371513
- ANSI:
- ANSI Approved
- Number of Pages:
- 17
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