This technical report provides a comprehensive summary of the state of transient latch-up. It was hoped that by compiling a summary of the state of knowledge on the subject, it would make it clear whether a single transient latch-up test was needed or if a small set of stress tests could cover a large fraction of the integrated circuits which have latch-up sensitivity when exposed to transient signals.
- Published:
- 2013
- Number of Pages:
- 67
- File Size:
- 1 file , 1.8 MB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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