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TIA TIA-455-127

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The intent of this test procedure is to measure the centralwavelength, peak wavelength, and thespectral width (rms, MSTM, 15 dB down and FWHM)(Footnote 1) of aMultilongitudinal Mode (MLM)semiconductor laser diode using a dispersive spectrophotometric (usinga revolving diffractiongrating) method or other suitable methods.

EYE SAFETY WARNING. Exercise care to avoid possible eye damage fromlooking into the end of anenergized fiber from a laser source. Most importantly, personnelshould avoid looking into anyenergized fiber using any type of magnification device.

Footnote 1 – rms is the Root Mean Square, MSTM is the Maximum SkewTenth Maximum (10 dB down) andFWHM is Full Width Half Maximum (3 dB down).

Edition:
91
Published:
11/01/1991
Number of Pages:
18
File Size:
1 file , 340 KB

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TIA TIA-455-127
Original price was: $100.00.Current price is: $50.00.