W/D S/S BY IEC 61280-2-2
This procedure describes a method of measuring the repetitive temporalcharacteristics of atwo-level, intensity-modulated optical waveform (eye pattern) at anoptical interface point. Fromthe measured eye pattern, waveform parameters such as rise time, falltime, overshoot, andextinction ratio can be extracted. Alternatively, the waveform can betested for compliance with apredetermined waveform mask. The primary components of the measurementsystem are a photodetector,a low-pass filter, and an oscilloscope, as shown in figure 1.
The bandwidth and other characteristics of the low-pass filter dependon the application. Refer toproduct-specific documentation for the specification of the low-passfilter transfer function.
- Edition:
- A
- Published:
- 11/01/1997
- Number of Pages:
- 27
- File Size:
- 1 file , 840 KB
Reviews
There are no reviews yet.