This publication examines the LTS requirements of wafers, dice, and packaged solid-state devices.The user should evaluate and choose the best practices to ensure their product will maintain as-received device integrity and minimize age- and storage-related degradation effects.
- Published:
- 11/01/2011
- Number of Pages:
- 26
- File Size:
- 1 file , 82 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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