This white paper presents the recent knowledge of system ESD field events and air discharge testing methods. Testing experience with the IEC 61000-4-2 (2008) and the ISO 10605 ESD standards has shown a range of differing interpretations of the test method and its scope. This often results in misapplication of the test method and a high test result uncertainty. This white paper aims to explain the problems observed and to suggest improvements to the ESD test standard and to enable a correlation with a SEED IC/PCB co-design methodology.
- Published:
- 10/01/2022
- Number of Pages:
- 144
- File Size:
- 1 file , 8.1 MB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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