The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.
- Published:
- 08/01/2003
- Number of Pages:
- 20
- File Size:
- 1 file , 110 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
Reviews
There are no reviews yet.