The method described in this document applies to all reliability mechanisms associated with electronic devices.
The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.
- Published:
- 03/01/2022
- Number of Pages:
- 20
- File Size:
- 1 file , 370 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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