W/D NO S/S * SAME AS NMA MS24
Purpose and scope
This standard addresses routine usage of test target elements forquality control testing.It does not address any precise evaluation ofspecifically defined characteristics (resolution, modulation transferfunction, sensitometry, etc.) of an imaging system.The total targetarea described in this standard is based on the dedicated image areaspecified in ANSI/AIIM MS41.
The format of this standard allows the user to prepare a test target foran image area that is determined by the selection of a reduction ratio.This standard requires the notation of the reduction ratio used increating the subsequent microfilm image of the test target.
The preferred locations for the optional 50-percent and 6-precentreflectance charts were derived from limitations of meter arm movementof some camera constructions.The location of these reflectance chartswill not satisfy all current camera constructions.It is expected,however, that the user will use the optional chart placements necessaryto accommodate the meter arm movement of the user’s camera.
In the interest of economy, elements may be arranged and/or combined asa single test target for use at different reductions.If this option isexercised, the applicable dimensions that are based on the selectedreduction ratio must be calculated accordingly.Overlap of elements isunacceptable
This standard specifies the minimum test target elements, theircomposition, and other criteria that addresses routine usage fortesting.The test target elements are used by a 35 mm planetarymicrofilm camera when microfilming source document engineering graphics.Test targets for COM/CAD engineering graphics are not covered in thisstandard.
- Edition:
- 80
- Published:
- 01/01/1996
- ANSI:
- ANSI Approved
- Number of Pages:
- 9
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