AS IEC 61164 – Reliability growth – Statistical test and estimation methods
Adopts IEC 61164 Ed. 2.0 (2004) to describe the power law reliability growth model and related projection model, with step-by-step guidance on their use.
Product Details
- Edition:
- 1st
- Published:
- 01/01/2008
- ISBN(s):
- 0733788408
- Number of Pages:
- 49
- File Size:
- 1 file , 1.8 MB
- Product Code(s):
- 10085740, 10085719, 10085756
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
Reviews
There are no reviews yet.