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ECIA EIA-364-25E

Original price was: $20.00.Current price is: $10.00.

ANSI APPROVED

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of contacts during test by inserting probes into socket contacts. The purpose of this test is as follows:

— to simulate probing of socket contacts while installed in the connector for non-removable contacts and for removable contacts while outside of the connector housing;

— to verify performance characteristics of the socket contacts have not been adversely impacted as may be specified in the referencing document (i.e. engagement and separation forces).

Edition:
E
Published:
03/01/2017
ANSI:
ANSI Approved
Number of Pages:
13
File Size:
0 files

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ECIA EIA-364-25E
Original price was: $20.00.Current price is: $10.00.