This test is conducted for the purpose of determining theresistance of a given electrical connector or socket to exposure atextremes of high and low temperatures and to the shock of alternateexposures to these extremes, simulating the worst probableconditions of storage, transportation and application.
NOTE — This procedure includes the provision for testing atcryogenic temperatures. Cryogenic temperatures should only be usedwith specimens specifically designed to be compatible with suchtemperatures.
- Edition:
- G
- Published:
- 08/01/2014
- ANSI:
- ANSI Approved
- Number of Pages:
- 17
- File Size:
- 0 files
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