ESD TR23.0-01-20 covers certain aspects of the control, mitigation, and monitoring of electrical stresses which may cause EOS damage. These stresses may occur during the processing, assembly, installation, or testing, of electrical or electronic parts, assemblies, and equipment. In general, this includes sources of excessive voltage, current or power.
- Published:
- 2020
- Number of Pages:
- 38
- File Size:
- 1 file , 1.7 MB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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