The information and procedures defined in this technical report may be used to search for latch-up sensitive layouts within integrated circuits. The stress levels and stimuli parameter values defined may be used for a wide range of devices.Levels and values can be scaled up or down to suit the requirements of the actual device under test and types of transient stimuli being used.
- Published:
- 2011
- ANSI:
- ANSI Approved
- Number of Pages:
- 36
- File Size:
- 1 file , 230 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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