ETSI TS 102 841 contains the Profile Test Specification (PTS) and the Test Case Library (TCL) for “NewGeneration DECT; Part 3: Extended wideband speech” (TS 102 527-3 [14]). The present document covers both thePortable (PT) and the Fixed (FT) Radio terminations.
The Test Case Library (TCL) covers also some test cases for “DECT New Generation; Part 1: Wideband speech”(TS 102 527-1 [13]) and for the “Generic Access Profile” (EN 300 444 [12]). This is done because such test cases aremandatory or especially relevant for New Generation DECT part 3 (see TS 102 527-3 [14]), and are not covered byexisting GAP test specifications.
Due to the ascending compatibility of DECT profiles, all New Generation DECT part 3 devices (see TS 102 527-3 [14])are required to be also compliant with “DECT New Generation; Part 1: Wideband speech” (TS 102 527-1 [13]) andwith the “Generic Access Profile” (GAP, EN 300 444 [12]). Annex D of the present document specifies themodifications to GAP test cases for requirements and tests that are optional in GAP test specifications (see note), butthat become mandatory by the support of the corresponding GAP features in New Generation DECT Part 3.
- Edition:
- 1.5.1
- Published:
- 01/01/2014
- Number of Pages:
- 324
- File Size:
- 1 file , 1.5 MB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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