This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
- Published:
- 03/01/1966
- Number of Pages:
- 9
- File Size:
- 1 file , 300 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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