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JEDEC JESD22-B118

Original price was: $92.00.Current price is: $46.00.

This inspection method is for product semiconductor wafers and dice prior to assembly. This test method defines the requirements to execute a standardized external visual inspection and is a non-invasive and nondestructive examination that can be used for qualification, quality monitoring, and lot acceptance.

Published:
03/01/2011
Number of Pages:
18
File Size:
1 file , 770 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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JEDEC JESD22-B118
Original price was: $92.00.Current price is: $46.00.