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JEDEC JESD60A

Original price was: $74.00.Current price is: $37.00.

This method establishes a standard procedure for accelerated testing of the hot-carrier-induced change of a p-channel MOSFET. The objective is to provide a minimum set of measurements so that accurate comparisons can be made between different technologies. The measurements specified should be viewed as a starting pint in the characterization and benchmarking of the trasistor manufacturing process.

Published:
09/01/2004
Number of Pages:
24
File Size:
1 file , 85 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus

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JEDEC JESD60A
Original price was: $74.00.Current price is: $37.00.